• visualize the charge and capacitance characteristics of MOS capacitors
• describe the operation principle of charge couple devices and CMOS active-pixel sensor to construct a digital camera
• calculate the current voltage characteristics of MOSFETs
• explain how the reduction of transistor dimensions and device scaling drive the technology development
• identify the most important parameters to control short channel effects
• construct short channel MOSFETs
• communication in the language of nano-CMOS technology

Week 1: MOS capacitor charges and capacitances
Introduction to the MOS capacitor structures, its charge and capacitance characteristics

Week 2: Charge coupled device, CMOS active-pixel sensor and MOS capacitor with a source
The operation principle of charge coupled devices, CMOS active pixel sensor for digital camera applications. The effect of adding a source to the MOS capacitor.

Week 3: Classical MOSFET I-V characteristics
Derivation of the classical MOSFET equations and the subthreshold characteristics.

Week 4: Mobility degradation and carrier velocity saturation
Correction to the classical pinchoff model by including the effect of mobility degradation and carrier velocity saturation.

Week 5: CMOS device scaling and short channel MOSFET
The effect of transistor scaling, short channel effects and the problems of small transistor design.

Week 6: Non-traditional nano-CMOS transistors
Introduction to the state-of-the-art transistors structure including SOI technology, FinFET, multi-gate MOSFET, tunnelling transistor and transistors based on 2-D materials.

Week 7: Final Exam